Parent page for the description of PSPS catalogs.
Planned contents:
- Data organization (Brian, Jeff, Rick)
- types of catalog properties, list of tables, data volume
- Detection Properties (Stefano, Jeff)
- definition
- PSF photometry - instrumental flux, uncertainty, FWHM, shape parameters, masked pixels, fit quality
- -> PSF fits
- -> Photometric zero points
- Aperture photometry
- Kron photometry
- image smoothing, sky level, measuring moments, aperture size, iterations
- -> Forced Photometry
- Mean Objects (Stefano)
- definition, not always 1-to-1 with astrophysical sources, outlier rejection, uncertainties
- -> Forced Photometry
- Stack Objects (Jeff)
- -> Forced Photometry
- Data Quality Flags (Armin)
- Catalog Anomalies - spurious objects
- Forced Photometry
- warps
- diffims
- Parameter accuracy (Nigel)
- galaxies (Dave)
- stars
Contents